Graphite for purification and coatings
-   High purity graphiteMersen has developed processes designed to significantly improve the physicochemical properties of materials, particularly when required for high-tech applications subjected to high stresses. Mersen offers the ETV-ICP (Electro Thermal Vaporization & Inductively Coupled Plasma) analytical method to measure the graphite purity. 
-   High-tech constraints of semiconductor and PV industriesPurity constraints:- Our purity processes allow us to achieve extremely low impurity levels, to below 5 ppm.
- The ETV-ICP method is used to detect and monitor impurities to levels below 5 ppb.
 Cleanliness constraints:- Vitreous Carbon Impregnation (VCI) was developed to reduce particle emissions and the vacuum outgassing of materials, particularly for semi-conductor applications.
   Resistance to reagents used in plasma processes:- Mersen products can be coated with a thin layer of pyrolitic carbon thereby reducing the material's permeability to reactive products to a minimum, particularly for semi-conductor applications.
- In order to further enhance the resistance to process reagents, Mersen proposes core impregnation with resin to reduce porosities.
   Resistance to hydrogen above 900 °C, MOCVD reagents, and strong acids (HCL, HF)- Mersen has mastered the deposition of silicon carbide thin films which provides unequalled protection of graphite equipment in particularly harsh environments.
   
-   Product literatureTechnical documentation- ETV-ICP OES - detecting limits for high purity carbon and graphite - pdf - 1.82 MB | Nov. 28, 2024